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ABSTRACT
A Complexity Science Study: Effect of Critical Current Density on Semiconductor Laser Diodes and Integrated Circuits
Complexity science is becoming increasingly poplular in order to more effectively tackle with the convoluted and multi-dimentional problems. In this work, we discuss the application of complexity science based on the case study of reliability physics of semiconductor laser diodes (LDs) and integrated circuits (ICs). We show the common effect of critical current density on laser diode and IC interconnect, and discuss its implication in device design. Our study also demonstrates that universal law of complexity science could be applied to seemingly different fields as the innovative, inter-disciplinary approach to resolve the ever-increasing complex problems.
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